Statistical and thermal physics (1)
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Statistical and thermal physics (1)
Statistical andThermal PhysicsAn IntroductionMichael J. R. HochStatistical and Thermal PhysicsStatistical andThermal PhysicsAn IntroductionMichael J. Statistical and thermal physics (1) R. HochNational High Magnetic Field Laboratory and Department of Physics, Florida state University Tallahassee, USA andSchool of Physics, University of the Witwatersrand Johannesburg, South AfricaCRC PressTaylor & Francis Group Boca Raton London New YorkCRC Press is an imprint of theTaylor & Franci Statistical and thermal physics (1) s Croup, an informa businessA TAYLOR & FRANCIS BOOKTaylor & FrancisTaylor & Francis Group6000 Broken Sound Parkway NW, Suite 300Boca Raton, FL 33487-2Statistical and thermal physics (1)
742 '© 2011 by Taylor & Francis Group, LLCTaylor & Francis is an Informa businessNo claim to original U.S. Government worksVersion Date: 20131107InterStatistical andThermal PhysicsAn IntroductionMichael J. R. HochStatistical and Thermal PhysicsStatistical andThermal PhysicsAn IntroductionMichael J. Statistical and thermal physics (1) onable efforts have been made to publish reliable data and information, but the author and publisher cannot assume responsibility for the validity of all materials or the consequences of their use. The authors and publishers have attempted to trace the copyright holders of all material reproduced in Statistical and thermal physics (1) this publication and apologize to copyright holders if permission to publish in this form has not been obtained. If any copyright material has not beStatistical and thermal physics (1)
en acknowledged please write and let US know so we may rectify in any future reprint.Except as permitted under U.S. Copyright Law, no part of this booStatistical andThermal PhysicsAn IntroductionMichael J. R. HochStatistical and Thermal PhysicsStatistical andThermal PhysicsAn IntroductionMichael J. Statistical and thermal physics (1) ncluding photocopying, microfilming, and recording, or in any information storage or retrieval system, without written permission from the publishers.for permission to photocopy or use material electronically from this work, please access www.copy-right.com (http://www.copyright.com/) or contact the Statistical and thermal physics (1) Copyright Clearance Center, Inc. (CCC), 222 Rosewood Drive, Danvers, MA 01923, 978-750-8400. CCC is a not-for-profit organization that provides licenStatistical and thermal physics (1)
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