(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

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(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

ĨL cn N0LVuPARTICLE CHARACTERIZATION: LIGHT SCATTERING METHODSRenliang XuKluwer Academic PublishersParticle Characterization: Light Scattering Methods

(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990) sParticle Technology SeriesSeries EditorProfessor Brian Scarlett Technical University of DelftThe Kluwer Particle Technology Series of books is the su

ccessor to the Chapman and Hall Powder Technology Series. The aims are lhe same, the scope is wider. The particles involved may be solid or they may b (Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

e droplets. The size range may be granular, powder or nano-scale, rhe accent may be on materials or on equipment, it may be practical or theoretical.

(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

Each book can add one brick to a fascinating and vital technology. Such a vast field cannot be covered by a carefully organised tome or encyclopaedia.

ĨL cn N0LVuPARTICLE CHARACTERIZATION: LIGHT SCATTERING METHODSRenliang XuKluwer Academic PublishersParticle Characterization: Light Scattering Methods

(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990) the new millennium and I expect that the growth of th is series ofbooks will reflect that trend.Particle c har acterization: Light Scattering Methods

byRENLIANG XUBeckman Coulter, Miami, U.S.A.KLUWER ACADEMIC PUBLISHERSNEW YORK. BOSTON. DORDRECHT. LONDON. MOSCOWeBook ISBN:Print ISBN:0-306-47124-80-7 (Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990)

nsmitted in any form or by any means, electronic, mechanical, recording, or otherwise, without written consent from the PublisherCreated in the United

ĨL cn N0LVuPARTICLE CHARACTERIZATION: LIGHT SCATTERING METHODSRenliang XuKluwer Academic PublishersParticle Characterization: Light Scattering Methods

(Particle technology series) hans rumpf particle characterization light scattering methods springer (1990) iiAcknowledgementsxviiChapter 1 PARTICLE CHARACTERIZATION

ĨL cn N0LVuPARTICLE CHARACTERIZATION: LIGHT SCATTERING METHODSRenliang XuKluwer Academic PublishersParticle Characterization: Light Scattering Methods